LCFI Collaboration

Lancaster University

Lancaster LCFI Group:

(Old Lancaster LCFI page)
Charge transfer efficiency simulations (CTI) of CCD58. In a future electron-positron linear collider a radiation hard vertex detector will be required. CCDs are a proven technology in the design of a high precision vertex detector, however radiation damage to CCD elements produces defects within the silicon that reduces the transfer efficiency of collected charge. By studying CTI using simulations and experimental test systems, improvements to radiation hardness may be possible.

These simulations model a 3-phase serial readout buried channel CCD produced by E2V called CCD58.

Results from forthcoming experimental data at Liverpool University will allow confrontation with simulation.
Current status report of Radiation hardness simulations at Lancaster here.
Pictures of Liverpool ccd58 test stand and recent oscilloscope plots can be found here.

To meet the demands of the Internation Linear Collider column parallel CCD technology is required. At CCLRC - RAL a prototype column parallel CCD is currently under study. Some recent results are displayed here.

Simulation Parameters:

Simulation assumes radiation damage to the epitaxial bulk using a uniform trap concentration of 1x10^11 cm-3 for an Acceptor defect level at energy Ec - 0.17 eV. Charge collected represents c.1600 electrons.

Charge Transfer process:


Representation of charge transfer of signal charge

Recent Plots from CTI Simulations:


Comparison between Toy model and Simulated results for CTI at three readout frequencies.

Previous Talks:

IOP Annual Conference 2004 Charge Transfer Inefficiency Simulation for CCD vertex detector Studies.
LCFI - Liverpool: CCD58 (Nov 2004)
LCFI - Liverpool: CPC-1 (Nov 2004)